Profilometry is a technique used to extract topographical data from a surface. For example, we use Dektak to measure the thickness of thin films on the nanoscale. It is less precise than AFM, but it is faster. This can be a single point, a line scan or even a full three dimensional scan. The purpose of profilometry is to get surface morphology, step heights and surface roughness. It uses a diamond-tip stylus that contacts the sample. The tool maintains a constant stylus force as the sample stage moves the sample under the stylus tip to trace a profile. This tool profiles surface topography allowing measurement of step heights and lateral dimensions of features on your sample.
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